Cheryl Tulkoff

Cheryl Tulkoff has over 15 years of experience in electronics manufacturing with an emphasis on failure analysis and reliability. She has worked in both circuit card assembly and semiconductor fabrication processes. She is currently a Senior Reliability Engineer for National Instruments in Austin, Texas working on lead-free and corporate reliability initiatives. Cheryl earned a Bachelor of Mechanical Engineering degree from Georgia Tech. She is a published author and a member of IEEE and holds leadership positions in the WIE (Women In Engineering) and ASTR (Accelerated Stress Testing and Reliability) sections.